The Resource 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts

18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts

Label
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts
Title
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts
Title variation
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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  • eng
  • eng
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PQKB
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  • oG6mPCFV7pA
  • UCdiOFWf-9c
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4ljLEGidhCs
Language note
English
LC call number
TK7874.I176 2003
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IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
http://library.link/vocab/relatedWorkOrContributorName
  • Bolchini, C
  • IEEE Computer Society Fault-Tolerant Computing Technical Committee
  • IEEE Computer Society Test Technology Technical Committee
  • IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
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  • Integrated circuits
  • Fault-tolerant computing
  • Electrical & Computer Engineering
  • Electrical Engineering
  • Engineering & Applied Sciences
Label
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts
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Bibliographic Level Mode of Issuance: Monograph
Abbreviated title
  • dft
  • DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, 2003. PROCEEDINGS. 18TH IEEE INTERNATIONAL SYMPOSIUM ON
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online resource
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cr
Content category
text
Content type code
txt
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online
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computer
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c
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  • (SSID)ssj0000393962
  • (PQKBManifestationID)12108585
  • (PQKBTitleCode)TC0000393962
  • (PQKBWorkID)10386407
  • (PQKB)10832955
  • (EXLCZ)991000000000021737
Label
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts
Note
Bibliographic Level Mode of Issuance: Monograph
Abbreviated title
  • dft
  • DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, 2003. PROCEEDINGS. 18TH IEEE INTERNATIONAL SYMPOSIUM ON
Carrier category
online resource
Carrier category code
cr
Content category
text
Content type code
txt
Form of item
online
Media category
computer
Media type code
c
System control number
  • (SSID)ssj0000393962
  • (PQKBManifestationID)12108585
  • (PQKBTitleCode)TC0000393962
  • (PQKBWorkID)10386407
  • (PQKB)10832955
  • (EXLCZ)991000000000021737

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