The Resource A Beginners' Guide to Scanning Electron Microscopy, by Anwar Ul-Hamid, (electronic resource)

A Beginners' Guide to Scanning Electron Microscopy, by Anwar Ul-Hamid, (electronic resource)

Label
A Beginners' Guide to Scanning Electron Microscopy
Title
A Beginners' Guide to Scanning Electron Microscopy
Statement of responsibility
by Anwar Ul-Hamid
Creator
Contributor
Author
Author
Provider
Subject
Language
eng
Summary
This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area. The SEM is routinely used to study the surface structure and chemistry of a wide range of biological and synthetic materials at the micrometer to nanometer scale. Ease-of-use, typically facile sample preparation, and straightforward image interpretation, combined with high resolution, high depth of field, and the ability to undertake microchemical and crystallographic analysis, has made scanning electron microscopy one of the most powerful and versatile techniques for characterization today. Indeed, the SEM is a vital tool for the characterization of nanostructured materials and the development of nanotechnology. However, its wide use by professionals with diverse technical backgrounds—including life science, materials science, engineering, forensics, mineralogy, etc., and in various sectors of government, industry, and academia—emphasizes the need for an introductory text providing the basics of effective SEM imaging. A Beginners’ Guide to Scanning Electron Microscopy explains instrumentation, operation, image interpretation and sample preparation in a wide ranging yet succinct and practical text, treating the essential theory of specimen-beam interaction and image formation in a manner that can be effortlessly comprehended by the novice SEM user. This book provides a concise and accessible introduction to the essentials of SEM includes a large number of illustrations specifically chosen to aid readers' understanding of key concepts highlights recent advances in instrumentation, imaging and sample preparation techniques offers examples drawn from a variety of applications that appeal to professionals from diverse backgrounds
http://library.link/vocab/creatorName
Ul-Hamid, Anwar
http://bibfra.me/vocab/relation/httpidlocgovvocabularyrelatorsaut
I93dzgEe9bw
Image bit depth
0
LC call number
TA404.6
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
SpringerLink
http://library.link/vocab/subjectName
  • Surfaces (Physics)
  • Engineering
  • Microscopy
  • Nanotechnology
  • Characterization and Evaluation of Materials
  • Spectroscopy and Microscopy
  • Nanotechnology and Microengineering
  • Biological Microscopy
  • Nanotechnology
Label
A Beginners' Guide to Scanning Electron Microscopy, by Anwar Ul-Hamid, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Introduction -- Components of the SEM -- Beam-Specimen Interaction -- Imaging with the SEM -- Microchemical Analysis with the SEM -- Sample Preparation
Dimensions
unknown
Extent
XXII, 402 p. 220 illus., 98 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783319984827
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-3-319-98482-7
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-319-98482-7
Label
A Beginners' Guide to Scanning Electron Microscopy, by Anwar Ul-Hamid, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Introduction -- Components of the SEM -- Beam-Specimen Interaction -- Imaging with the SEM -- Microchemical Analysis with the SEM -- Sample Preparation
Dimensions
unknown
Extent
XXII, 402 p. 220 illus., 98 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783319984827
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-3-319-98482-7
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-319-98482-7

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