The Resource Advanced Microscopy in Mycology, edited by Tanya E. S. Dahms, Kirk J. Czymmek, (electronic resource)

Advanced Microscopy in Mycology, edited by Tanya E. S. Dahms, Kirk J. Czymmek, (electronic resource)

Label
Advanced Microscopy in Mycology
Title
Advanced Microscopy in Mycology
Statement of responsibility
edited by Tanya E. S. Dahms, Kirk J. Czymmek
Contributor
Editor
Provider
Subject
Language
eng
Summary
This volume provides insight into the principles underscoring various advanced microscopy methods and how they have been, or have the potential to be, applied to mycology. Offering a comprehensive overview of the confocal principle, confocal laser scanning microscopy and its application to fungal biology, this text also examines the newer sophisticated fluorescence-based methods of technology
Member of
Image bit depth
0
LC call number
QH201-278.5
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Dahms, Tanya E. S.
  • Czymmek, Kirk J.
  • SpringerLink
Series statement
Fungal Biology,
http://library.link/vocab/subjectName
  • Life sciences
  • Cell biology
  • Developmental biology
  • Plant physiology
  • Microscopy
  • Life Sciences
  • Biological Microscopy
  • Plant Physiology
  • Cell Biology
  • Developmental Biology
Label
Advanced Microscopy in Mycology, edited by Tanya E. S. Dahms, Kirk J. Czymmek, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Applications of Confocal Laser Scanning Microscopy in Filamentous Fungi -- Fluorescence-based Methods for the Study of Protein Localization, Interaction, and Dynamics in Filamentous Fungi -- Super Resolution Microscopy: SIM, STED and Localization Microscopy -- Fourier Transform Infrared (FTIR) Microscopy and Imaging of Fungi -- Whole Cells Imaged by Hard X-ray Transmission Microscopy -- In situ Nanocharacterization of Yeast Cells Using ESEM and FIB -- Imaging Living Yeasts Cells and Quantifying Their Biophysical Properties by Atomic Force Microscopy -- Future Directions in Mycological Microscopy
Dimensions
unknown
Edition
1st ed. 2015.
Extent
XII, 164 p. 63 illus., 50 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783319224374
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other control number
10.1007/978-3-319-22437-4
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-319-22437-4
Label
Advanced Microscopy in Mycology, edited by Tanya E. S. Dahms, Kirk J. Czymmek, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
Applications of Confocal Laser Scanning Microscopy in Filamentous Fungi -- Fluorescence-based Methods for the Study of Protein Localization, Interaction, and Dynamics in Filamentous Fungi -- Super Resolution Microscopy: SIM, STED and Localization Microscopy -- Fourier Transform Infrared (FTIR) Microscopy and Imaging of Fungi -- Whole Cells Imaged by Hard X-ray Transmission Microscopy -- In situ Nanocharacterization of Yeast Cells Using ESEM and FIB -- Imaging Living Yeasts Cells and Quantifying Their Biophysical Properties by Atomic Force Microscopy -- Future Directions in Mycological Microscopy
Dimensions
unknown
Edition
1st ed. 2015.
Extent
XII, 164 p. 63 illus., 50 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783319224374
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Other control number
10.1007/978-3-319-22437-4
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-319-22437-4

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