The Resource Analog IC Reliability in Nanometer CMOS, by Elie Maricau, Georges Gielen, (electronic resource)

Analog IC Reliability in Nanometer CMOS, by Elie Maricau, Georges Gielen, (electronic resource)

Label
Analog IC Reliability in Nanometer CMOS
Title
Analog IC Reliability in Nanometer CMOS
Statement of responsibility
by Elie Maricau, Georges Gielen
Creator
Contributor
Author
Provider
Subject
Language
eng
Summary
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs. · Enables readers to understand long-term reliability of an integrated circuit; · Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes; · Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology; · Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit
Member of
http://library.link/vocab/creatorName
Maricau, Elie
Image bit depth
0
LC call number
TK7888.4
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Gielen, Georges.
  • SpringerLink
Series statement
Analog Circuits and Signal Processing
http://library.link/vocab/subjectName
  • Engineering
  • Electronics
  • Systems engineering
  • Engineering
  • Circuits and Systems
  • Electronics and Microelectronics, Instrumentation
  • Nanotechnology and Microengineering
Label
Analog IC Reliability in Nanometer CMOS, by Elie Maricau, Georges Gielen, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Introduction -- CMOS Reliability Overview -- Transistor Aging Compact Modeling -- Background on IC Reliability Simulation -- Analog IC Reliability Simulation -- Integrated Circuit Reliability -- Conclusions
Dimensions
unknown
Extent
XVI, 198 p. 95 illus., 27 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9781461461630
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-1-4614-6163-0
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-1-4614-6163-0
Label
Analog IC Reliability in Nanometer CMOS, by Elie Maricau, Georges Gielen, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Introduction -- CMOS Reliability Overview -- Transistor Aging Compact Modeling -- Background on IC Reliability Simulation -- Analog IC Reliability Simulation -- Integrated Circuit Reliability -- Conclusions
Dimensions
unknown
Extent
XVI, 198 p. 95 illus., 27 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9781461461630
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-1-4614-6163-0
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-1-4614-6163-0

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