The Resource Bias Temperature Instability for Devices and Circuits, edited by Tibor Grasser, (electronic resource)

Bias Temperature Instability for Devices and Circuits, edited by Tibor Grasser, (electronic resource)

Label
Bias Temperature Instability for Devices and Circuits
Title
Bias Temperature Instability for Devices and Circuits
Statement of responsibility
edited by Tibor Grasser
Creator
Contributor
Editor
Provider
Subject
Language
eng
Summary
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime. · Enables readers to understand and model negative bias temperature instability, with an emphasis on dynamics; · Includes coverage of DC vs. AC stress, duty factor dependence and bias dependence; · Explains time dependent defect spectroscopy, as a measurement method that operates on nanoscale MOSFETs; · Introduces new defect model for metastable defect states, nonradiative multiphonon theory and stochastic behavior
http://library.link/vocab/creatorName
Grasser, Tibor
Image bit depth
0
LC call number
TK7888.4
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
SpringerLink
http://library.link/vocab/subjectName
  • Engineering
  • System safety
  • Electronics
  • Systems engineering
  • Engineering
  • Circuits and Systems
  • Semiconductors
  • Electronics and Microelectronics, Instrumentation
  • Quality Control, Reliability, Safety and Risk
Label
Bias Temperature Instability for Devices and Circuits, edited by Tibor Grasser, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Introduction -- Characterization, Experimental Challenges -- Advanced Characterization -- Characterization of Nanoscale Devices -- Statistical Properties/Variability -- Theoretical Understanding -- Possible Defects: Experimental -- Possible Defects: First Principles -- Modeling -- Technological Impact -- Silicon dioxides/SiON -- High-k oxides -- Alternative technologies -- Circuits
Dimensions
unknown
Extent
XI, 810 p. 601 illus., 318 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9781461479093
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-1-4614-7909-3
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-1-4614-7909-3
Label
Bias Temperature Instability for Devices and Circuits, edited by Tibor Grasser, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Introduction -- Characterization, Experimental Challenges -- Advanced Characterization -- Characterization of Nanoscale Devices -- Statistical Properties/Variability -- Theoretical Understanding -- Possible Defects: Experimental -- Possible Defects: First Principles -- Modeling -- Technological Impact -- Silicon dioxides/SiON -- High-k oxides -- Alternative technologies -- Circuits
Dimensions
unknown
Extent
XI, 810 p. 601 illus., 318 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9781461479093
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-1-4614-7909-3
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-1-4614-7909-3

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