The Resource Contactless VLSI Measurement and Testing Techniques, by Selahattin Sayil, (electronic resource)

Contactless VLSI Measurement and Testing Techniques, by Selahattin Sayil, (electronic resource)

Label
Contactless VLSI Measurement and Testing Techniques
Title
Contactless VLSI Measurement and Testing Techniques
Statement of responsibility
by Selahattin Sayil
Creator
Contributor
Author
Provider
Subject
Language
eng
Summary
This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing. The techniques described in this book address the increasing demands for internal access of the logic state of a node within a chip under test: Provides a single-source reference on contactless probing approaches for VLSI testing and diagnostic measurement Introduces readers to various optical contactless testing techniques, such as Electro-Optic Probing, Charge Density Probe, and Photo-emissive Probe Discusses the applicability and adaptability of each technique, based on multilayer metallization, wafer level techniques, and invasiveness Provides a comparison among various contactless testing techniques Describes a variety of industrial applications of contactless VLSI testing
http://library.link/vocab/creatorName
Sayil, Selahattin
Image bit depth
0
LC call number
TK7888.4
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
SpringerLink
http://library.link/vocab/subjectName
  • Engineering
  • Microprocessors
  • Electronics
  • Microelectronics
  • Electronic circuits
  • Engineering
  • Circuits and Systems
  • Processor Architectures
  • Electronics and Microelectronics, Instrumentation
Label
Contactless VLSI Measurement and Testing Techniques, by Selahattin Sayil, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
1. Conventional Test Methods. – 2. Testability Design -- 3. Other Techniques Based on the Contacting Probe -- 4. Contactless Testing -- 5. Electron-Beam and Photoemission Probing -- 6. Electro Optic Sampling and Charge Density Probe -- 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe -- 8. Probing Techniques Based on Light Emission from Chip -- 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits -- 10. Comparison of Contactless Testing Methodologies
Dimensions
unknown
Extent
V, 93 p. 34 illus., 11 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783319696737
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-3-319-69673-7
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-319-69673-7
Label
Contactless VLSI Measurement and Testing Techniques, by Selahattin Sayil, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
1. Conventional Test Methods. – 2. Testability Design -- 3. Other Techniques Based on the Contacting Probe -- 4. Contactless Testing -- 5. Electron-Beam and Photoemission Probing -- 6. Electro Optic Sampling and Charge Density Probe -- 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe -- 8. Probing Techniques Based on Light Emission from Chip -- 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits -- 10. Comparison of Contactless Testing Methodologies
Dimensions
unknown
Extent
V, 93 p. 34 illus., 11 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783319696737
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-3-319-69673-7
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-319-69673-7

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