Coverart for item
The Resource Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan, edited by Hiroshi Yamada-Kaneta and Akira Sakai

Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan, edited by Hiroshi Yamada-Kaneta and Akira Sakai

Label
Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan
Title
Defects-recognition, imaging and physics in semiconductors XIV
Title remainder
selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan
Statement of responsibility
edited by Hiroshi Yamada-Kaneta and Akira Sakai
Creator
Contributor
Provider
Subject
Genre
Language
eng
Member of
Cataloging source
CaPaEBR
Index
no index present
LC call number
QC611.6.D4
LC item number
I58 2011eb
Literary form
non fiction
http://bibfra.me/vocab/lite/meetingDate
2011
http://bibfra.me/vocab/lite/meetingName
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors
Nature of contents
dictionaries
http://library.link/vocab/relatedWorkOrContributorName
  • Yamada-Kaneta, Hiroshi
  • Sakai, Akira
  • ebrary
Series statement
Materials science forum
Series volume
vol. 725
http://library.link/vocab/subjectName
  • Semiconductors
  • Physics
Label
Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan, edited by Hiroshi Yamada-Kaneta and Akira Sakai
Instantiates
Publication
Copyright
Carrier category
online resource
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type MARC source
rdacontent
Dimensions
unknown
Extent
1 online resource (300 pages).
Form of item
online
Isbn
9783038138563
Media category
computer
Media MARC source
rdamedia
Note
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
Specific material designation
remote
System control number
  • (OCoLC)809121077
  • (CaPaEBR)ebr10777688
Label
Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan, edited by Hiroshi Yamada-Kaneta and Akira Sakai
Publication
Copyright
Carrier category
online resource
Carrier MARC source
rdacarrier
Color
multicolored
Content category
text
Content type MARC source
rdacontent
Dimensions
unknown
Extent
1 online resource (300 pages).
Form of item
online
Isbn
9783038138563
Media category
computer
Media MARC source
rdamedia
Note
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.
Specific material designation
remote
System control number
  • (OCoLC)809121077
  • (CaPaEBR)ebr10777688

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