The Resource Design for Manufacturability : From 1D to 4D for 90–22 nm Technology Nodes, by Artur Balasinski, (electronic resource)

Design for Manufacturability : From 1D to 4D for 90–22 nm Technology Nodes, by Artur Balasinski, (electronic resource)

Label
Design for Manufacturability : From 1D to 4D for 90–22 nm Technology Nodes
Title
Design for Manufacturability
Title remainder
From 1D to 4D for 90–22 nm Technology Nodes
Statement of responsibility
by Artur Balasinski
Creator
Contributor
Author
Provider
Subject
Language
eng
Summary
This book explains integrated circuit design for manufacturability (DfM) at the product level (packaging, applications) and applies engineering DfM principles to the latest standards of product development at 22 nm technology nodes. It is a valuable guide for layout designers, packaging engineers and quality engineers, covering DfM development from 1D to 4D, involving IC design flow setup, best practices, links to manufacturing and product definition, for process technologies down to 22 nm node, and product families including memories, logic, system-on-chip and system-in-package. · Provides design for manufacturability guidelines on layout techniques for the most advanced, 22 nm technology nodes; · Includes information valuable to layout designers, packaging engineers and quality engineers, working on memories, logic, system-on-chip and system-in-package; · Offers a highly-accessible, single-source reference to information otherwise available only from disparate sources; · Helps readers to translate reliability methodology into real design flows
http://library.link/vocab/creatorName
Balasinski, Artur
Image bit depth
0
LC call number
TK7888.4
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
SpringerLink
http://library.link/vocab/subjectName
  • Engineering
  • System safety
  • Electronics
  • Systems engineering
  • Engineering
  • Circuits and Systems
  • Electronics and Microelectronics, Instrumentation
  • Quality Control, Reliability, Safety and Risk
Label
Design for Manufacturability : From 1D to 4D for 90–22 nm Technology Nodes, by Artur Balasinski, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Preface -- Classic DfM: from 2D to 3D -- DfM at 28 nm and Beyond -- New DfM Domain: Stress Effects -- Conclusions and Future Work
Dimensions
unknown
Extent
VIII, 278 p. 214 illus., 45 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9781461417613
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-1-4614-1761-3
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-1-4614-1761-3
Label
Design for Manufacturability : From 1D to 4D for 90–22 nm Technology Nodes, by Artur Balasinski, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Preface -- Classic DfM: from 2D to 3D -- DfM at 28 nm and Beyond -- New DfM Domain: Stress Effects -- Conclusions and Future Work
Dimensions
unknown
Extent
VIII, 278 p. 214 illus., 45 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9781461417613
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-1-4614-1761-3
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-1-4614-1761-3

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