The Resource Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms, by Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky, (electronic resource)

Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms, by Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky, (electronic resource)

Label
Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms
Title
Dielectric Breakdown in Gigascale Electronics
Title remainder
Time Dependent Failure Mechanisms
Statement of responsibility
by Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky
Creator
Contributor
Author
Provider
Subject
Language
eng
Summary
This book focuses on the experimental and theoretical aspects of the time-dependent breakdown of advanced dielectric films used in gigascale electronics. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance for engineers and scientists working on developing and integrating present and future chip architectures. The book is specifically designed to aid scientists in assessing the reliability and robustness of electronic systems employing low-k dielectric materials such as nano-porous films. Similarly, the models presented here will help to improve current methodologies for estimating the failure of gigascale electronics at device operating conditions from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics. Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will gain expertise on conventional as well as new field acceleration test models for predicting long term dielectric degradation
Member of
http://library.link/vocab/creatorName
Borja, Juan Pablo
Image bit depth
0
LC call number
TA1750-1750.22
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Lu, Toh-Ming.
  • Plawsky, Joel.
  • SpringerLink
Series statement
SpringerBriefs in Materials,
http://library.link/vocab/subjectName
  • Materials science
  • Electronic circuits
  • Nanotechnology
  • Optical materials
  • Electronic materials
  • Materials Science
  • Optical and Electronic Materials
  • Nanotechnology and Microengineering
  • Electronic Circuits and Devices
  • Nanotechnology
Label
Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms, by Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Introduction -- General Theories -- Measurement Tools and Test Structures -- Experimental Techniques -- Breakdown Experiments -- Kinetics of Charge Carrier Confinement in Thin Dielectrics -- Theory of Dielectric Breakdown in Nanoporous Thin Films -- Dielectric Breakdown in Copper Interconnects -- Reconsidering Conventional Models
Dimensions
unknown
Extent
VIII, 105 p. 74 illus., 33 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783319432205
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-3-319-43220-5
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-319-43220-5
Label
Dielectric Breakdown in Gigascale Electronics : Time Dependent Failure Mechanisms, by Juan Pablo Borja, Toh-Ming Lu, Joel Plawsky, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Introduction -- General Theories -- Measurement Tools and Test Structures -- Experimental Techniques -- Breakdown Experiments -- Kinetics of Charge Carrier Confinement in Thin Dielectrics -- Theory of Dielectric Breakdown in Nanoporous Thin Films -- Dielectric Breakdown in Copper Interconnects -- Reconsidering Conventional Models
Dimensions
unknown
Extent
VIII, 105 p. 74 illus., 33 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9783319432205
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-3-319-43220-5
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-319-43220-5

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