The Resource Disorder and Critical Phenomena Through Basic Probability Models : École d’Été de Probabilités de Saint-Flour XL – 2010, by Giambattista Giacomin, (electronic resource)

Disorder and Critical Phenomena Through Basic Probability Models : École d’Été de Probabilités de Saint-Flour XL – 2010, by Giambattista Giacomin, (electronic resource)

Label
Disorder and Critical Phenomena Through Basic Probability Models : École d’Été de Probabilités de Saint-Flour XL – 2010
Title
Disorder and Critical Phenomena Through Basic Probability Models
Title remainder
École d’Été de Probabilités de Saint-Flour XL – 2010
Statement of responsibility
by Giambattista Giacomin
Creator
Contributor
Author
Provider
Subject
Language
eng
Summary
Understanding the effect of disorder on critical phenomena is a central issue in statistical mechanics. In probabilistic terms: what happens if we perturb a system exhibiting a phase transition by introducing a random environment? The physics community has approached this very broad question by aiming at general criteria that tell whether or not the addition of disorder changes the critical properties of a model: some of the predictions are truly striking and mathematically challenging. We approach this domain of ideas by focusing on a specific class of models, the "pinning models," for which a series of recent mathematical works has essentially put all the main predictions of the physics community on firm footing; in some cases, mathematicians have even gone beyond, settling a number of controversial issues. But the purpose of these notes, beyond treating the pinning models in full detail, is also to convey the gist, or at least the flavor, of the "overall picture," which is, in many respects, unfamiliar territory for mathematicians
Member of
http://library.link/vocab/creatorName
Giacomin, Giambattista
Image bit depth
0
LC call number
  • QA273.A1-274.9
  • QA274-274.9
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
SpringerLink
Series statement
Lecture Notes in Mathematics,
Series volume
2025
http://library.link/vocab/subjectName
  • Mathematics
  • Distribution (Probability theory)
  • Mathematical physics
  • Mathematics
  • Probability Theory and Stochastic Processes
  • Applications of Mathematics
  • Statistical Physics, Dynamical Systems and Complexity
  • Mathematical Methods in Physics
Label
Disorder and Critical Phenomena Through Basic Probability Models : École d’Été de Probabilités de Saint-Flour XL – 2010, by Giambattista Giacomin, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
1 Introduction -- 2 Homogeneous pinning systems: a class of exactly solved models -- 3 Introduction to disordered pinning models -- 4 Irrelevant disorder estimates -- 5 Relevant disorder estimates: the smoothing phenomenon -- 6 Critical point shift: the fractional moment method -- 7 The coarse graining procedure -- 8 Path properties
Dimensions
unknown
Extent
XI, 130p. 12 illus.
File format
multiple file formats
Form of item
electronic
Isbn
9783642211560
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-3-642-21156-0
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-642-21156-0
Label
Disorder and Critical Phenomena Through Basic Probability Models : École d’Été de Probabilités de Saint-Flour XL – 2010, by Giambattista Giacomin, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
1 Introduction -- 2 Homogeneous pinning systems: a class of exactly solved models -- 3 Introduction to disordered pinning models -- 4 Irrelevant disorder estimates -- 5 Relevant disorder estimates: the smoothing phenomenon -- 6 Critical point shift: the fractional moment method -- 7 The coarse graining procedure -- 8 Path properties
Dimensions
unknown
Extent
XI, 130p. 12 illus.
File format
multiple file formats
Form of item
electronic
Isbn
9783642211560
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-3-642-21156-0
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-642-21156-0

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