The Resource Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization, by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin, (electronic resource)

Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization, by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin, (electronic resource)

Label
Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization
Title
Field Emission Scanning Electron Microscopy
Title remainder
New Perspectives for Materials Characterization
Statement of responsibility
by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
Creator
Contributor
Author
Provider
Subject
Language
eng
Summary
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
Member of
http://library.link/vocab/creatorName
Brodusch, Nicolas
Image bit depth
0
LC call number
TA404.6
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Demers, Hendrix.
  • Gauvin, Raynald.
  • SpringerLink
Series statement
SpringerBriefs in Applied Sciences and Technology,
http://library.link/vocab/subjectName
  • Materials science
  • Spectrum analysis
  • Microscopy
  • Nanotechnology
  • Materials Science
  • Characterization and Evaluation of Materials
  • Spectroscopy and Microscopy
  • Nanotechnology and Microengineering
Label
Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization, by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Dimensions
unknown
Extent
XII, 137 p. 53 illus., 20 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9789811044335
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-981-10-4433-5
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-981-10-4433-5
Label
Field Emission Scanning Electron Microscopy : New Perspectives for Materials Characterization, by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Dimensions
unknown
Extent
XII, 137 p. 53 illus., 20 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9789811044335
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-981-10-4433-5
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-981-10-4433-5

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