The Resource High-Resolution X-Ray Scattering from Thin Films and Multilayers, by Václav Holý, Ullrich Pietsch, Tilo Baumbach, (electronic resource)

High-Resolution X-Ray Scattering from Thin Films and Multilayers, by Václav Holý, Ullrich Pietsch, Tilo Baumbach, (electronic resource)

Label
High-Resolution X-Ray Scattering from Thin Films and Multilayers
Title
High-Resolution X-Ray Scattering from Thin Films and Multilayers
Statement of responsibility
by Václav Holý, Ullrich Pietsch, Tilo Baumbach
Creator
Contributor
Author
Provider
Subject
Language
eng
Summary
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis
Member of
http://library.link/vocab/creatorName
Holý, Václav
Image bit depth
0
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Pietsch, Ullrich.
  • Baumbach, Tilo.
  • SpringerLink
Series statement
Springer Tracts in Modern Physics,
Series volume
149
http://library.link/vocab/subjectName
  • Physics
  • Crystallography
  • Spectrum analysis
  • Surfaces (Physics)
  • Physics
  • Optical Spectroscopy, Ultrafast Optics
  • Surfaces and Interfaces, Thin Films
  • Crystallography
Label
High-Resolution X-Ray Scattering from Thin Films and Multilayers, by Václav Holý, Ullrich Pietsch, Tilo Baumbach, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Basic elements of the equipment -- Diffractometers and reflectometers -- Scans and resolution in angular and reciprocal space -- Basic principles -- Kinematical scattering theory -- Dynamical scattering theory -- Layer thicknesses of single layers and multilayers -- Lattice parameters and lattice strains in single expitaxial layers -- Volume defects in layers -- X-ray reflection by rough multilayers -- X-ray scattering by gratings and dots -- A. Wave vectors and amplitudes of the internal wavefields in a dynamically scattering crystal
Dimensions
unknown
Extent
XI, 258 p.
File format
multiple file formats
Form of item
electronic
Isbn
9783540496250
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/BFb0109385
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-540-49625-0
Label
High-Resolution X-Ray Scattering from Thin Films and Multilayers, by Václav Holý, Ullrich Pietsch, Tilo Baumbach, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Basic elements of the equipment -- Diffractometers and reflectometers -- Scans and resolution in angular and reciprocal space -- Basic principles -- Kinematical scattering theory -- Dynamical scattering theory -- Layer thicknesses of single layers and multilayers -- Lattice parameters and lattice strains in single expitaxial layers -- Volume defects in layers -- X-ray reflection by rough multilayers -- X-ray scattering by gratings and dots -- A. Wave vectors and amplitudes of the internal wavefields in a dynamically scattering crystal
Dimensions
unknown
Extent
XI, 258 p.
File format
multiple file formats
Form of item
electronic
Isbn
9783540496250
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/BFb0109385
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-540-49625-0

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