The Resource Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons, by Mathias Schubert, (electronic resource)

Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons, by Mathias Schubert, (electronic resource)

Label
Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons
Title
Infrared Ellipsometry on Semiconductor Layer Structures
Title remainder
Phonons, Plasmons, and Polaritons
Statement of responsibility
by Mathias Schubert
Creator
Contributor
Author
Provider
Subject
Language
eng
Summary
The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed
Member of
http://library.link/vocab/creatorName
Schubert, Mathias
Image bit depth
0
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
SpringerLink
Series statement
Springer Tracts in Modern Physics,
Series volume
209
http://library.link/vocab/subjectName
  • Chemistry
  • Physical optics
  • Optical materials
  • Surfaces (Physics)
  • Chemistry
  • Surfaces and Interfaces, Thin Films
  • Optical and Electronic Materials
  • Applied Optics, Optoelectronics, Optical Devices
  • Physics and Applied Physics in Engineering
Label
Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons, by Mathias Schubert, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Introduction -- Ellipsometry -- Infrared Model Dielectric Functions -- Polaritons in Semiconductor Layer Structures -- Anisotropic Substrates -- Zinsblende-Structure Materials (III-V) -- Wurtzite-Structure Materials (Group-III Nitrides, ZnO) -- Magneto-optic Ellipsometry
Dimensions
unknown
Extent
XI, 193 p. 77 illus.
File format
multiple file formats
Form of item
electronic
Isbn
9783540447016
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/b11964
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-540-44701-6
Label
Infrared Ellipsometry on Semiconductor Layer Structures : Phonons, Plasmons, and Polaritons, by Mathias Schubert, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Introduction -- Ellipsometry -- Infrared Model Dielectric Functions -- Polaritons in Semiconductor Layer Structures -- Anisotropic Substrates -- Zinsblende-Structure Materials (III-V) -- Wurtzite-Structure Materials (Group-III Nitrides, ZnO) -- Magneto-optic Ellipsometry
Dimensions
unknown
Extent
XI, 193 p. 77 illus.
File format
multiple file formats
Form of item
electronic
Isbn
9783540447016
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/b11964
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-3-540-44701-6

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