The Resource Proceedings, Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Proceedings, Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Label
Proceedings
Title
Proceedings
Statement of responsibility
Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Creator
Contributor
Subject
Genre
Language
eng
Action
digitized
Citation coverage
1995-
Citation source
Chemical abstracts
Dewey number
  • 621
  • 621.3815/2
Entry convention
successive entry
Frequency
annual
LC call number
  • ISSN RECORD
  • TK7871.85
LC item number
.I27a
http://bibfra.me/vocab/lite/meetingName
IEEE Semiconductor Thermal Measurement and Management Symposium.
Nature of contents
dictionaries
Original alphabet or script of title
basic roman
Regularity
regular
http://library.link/vocab/relatedWorkOrContributorName
IEEE Components, Hybrids, and Manufacturing Technology Society
http://library.link/vocab/subjectName
  • Semiconductors
  • Semiconductors
  • Amorphous semiconductors
  • Integrated circuits
  • Amorphous semiconductors
  • Integrated circuits
  • Semiconductors
  • Semiconductors
Label
Proceedings, Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Instantiates
Publication
Antecedent source
file reproduced from original
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Dimensions
unknown
Form of item
online
Issuing body
Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.
Key title
Proceedings
Lccn
2018200150
Level of compression
  • lossless
  • lossy
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Publication designation
Began with: 7th (1991).
Publication frequency
Annual
Reformatting quality
  • preservation
  • access
Reproduction note
Electronic reproduction.
Specific material designation
remote
System control number
  • (OCoLC)556575073
  • (CONSER)--2018200150
  • (EXLCZ)99110978984565257
System details
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Label
Proceedings, Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Publication
Antecedent source
file reproduced from original
Carrier category
online resource
Carrier category code
  • cr
Carrier MARC source
rdacarrier
Color
black and white
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Dimensions
unknown
Form of item
online
Issuing body
Sponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.
Key title
Proceedings
Lccn
2018200150
Level of compression
  • lossless
  • lossy
Media category
computer
Media MARC source
rdamedia
Media type code
  • c
Publication designation
Began with: 7th (1991).
Publication frequency
Annual
Reformatting quality
  • preservation
  • access
Reproduction note
Electronic reproduction.
Specific material designation
remote
System control number
  • (OCoLC)556575073
  • (CONSER)--2018200150
  • (EXLCZ)99110978984565257
System details
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.

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