The Resource Quality engineering using robust design, Madhav S. Phadke

Quality engineering using robust design, Madhav S. Phadke

Label
Quality engineering using robust design
Title
Quality engineering using robust design
Statement of responsibility
Madhav S. Phadke
Creator
Subject
Language
eng
Cataloging source
DLC
http://library.link/vocab/creatorDate
1948-
http://library.link/vocab/creatorName
Phadke, Madhav Shridhar
Illustrations
illustrations
Index
index present
LC call number
TA174
LC item number
.P49 1989
Literary form
non fiction
Nature of contents
bibliography
http://library.link/vocab/subjectName
  • Engineering design
  • Computer-aided design
  • Integrated circuits
  • Conception technique
  • Conception assistée par ordinateur
  • Circuits intégrés à très grande échelle
  • Computer-aided design
  • Engineering design
  • Integrated circuits
  • Entwurf
  • Qualitätssicherung
  • Robustheit
Label
Quality engineering using robust design, Madhav S. Phadke
Instantiates
Publication
Note
  • At head of title: AT&T
  • Includes index
Bibliography note
Bibliography: p. 321-325
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • Quadratic Loss Function
  • Noise Factors--Causes of Variation
  • Average Quality Loss
  • Exploiting Nonlinearity
  • Classification of Parameters: P Diagram
  • Optimization of Product and Process Design
  • Role of Various Quality Control Activities
  • Matrix Experiments Using Orthogonal Arrays
  • Matrix Experiment for a CVD Process
  • Estimation of Factor Effects
  • A Historical Perspective
  • Additive Model for Factor Effects
  • Analysis of Variance
  • Prediction and Diagnosis
  • Steps in Robust Design
  • The Polysilicon Deposition Process and Its Main Function
  • Noise Factors and Testing Conditions
  • Quality Characteristics and Objective Functions
  • Control Factors and Their Levels
  • Matrix Experiment and Data Analysis Plan
  • Conducting the Matrix Experiment
  • What Is Quality?
  • Data Analysis
  • Verification Experiment and Future Plan
  • Signal-To-Noise Ratios
  • Optimization for Polysilicon Layer Thickness Uniformity
  • Evaluation of Sensitivity to Noise
  • S/N Ratios for Static Problems
  • S/N Ratios for Dynamic Problems
  • Analysis of Ordered Categorical Data
  • Achieving Additivity
  • Guidelines for Selecting Quality Characteristics
  • Elements of Cost
  • Examples of Quality Characteristics
  • Examples of S/N Ratios
  • Selection of Control Factors
  • Role of Orthogonal Arrays
  • Constructing Orthogonal Arrays
  • Fundamental Principle
  • Tools Used in Robust Design
  • Applications and Benefits of Robust Design
  • Principles of Quality Engineering
  • Quality Loss Function--The Fraction Defective Fallacy
Dimensions
25 cm
Extent
xviii, 334 pages
Isbn
9780137451678
Lccn
89003927
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
illustrations
System control number
  • (OCoLC)19455232
  • (OCoLC)ocm19455232
Label
Quality engineering using robust design, Madhav S. Phadke
Publication
Note
  • At head of title: AT&T
  • Includes index
Bibliography note
Bibliography: p. 321-325
Carrier category
volume
Carrier category code
  • nc
Carrier MARC source
rdacarrier
Content category
text
Content type code
  • txt
Content type MARC source
rdacontent
Contents
  • Quadratic Loss Function
  • Noise Factors--Causes of Variation
  • Average Quality Loss
  • Exploiting Nonlinearity
  • Classification of Parameters: P Diagram
  • Optimization of Product and Process Design
  • Role of Various Quality Control Activities
  • Matrix Experiments Using Orthogonal Arrays
  • Matrix Experiment for a CVD Process
  • Estimation of Factor Effects
  • A Historical Perspective
  • Additive Model for Factor Effects
  • Analysis of Variance
  • Prediction and Diagnosis
  • Steps in Robust Design
  • The Polysilicon Deposition Process and Its Main Function
  • Noise Factors and Testing Conditions
  • Quality Characteristics and Objective Functions
  • Control Factors and Their Levels
  • Matrix Experiment and Data Analysis Plan
  • Conducting the Matrix Experiment
  • What Is Quality?
  • Data Analysis
  • Verification Experiment and Future Plan
  • Signal-To-Noise Ratios
  • Optimization for Polysilicon Layer Thickness Uniformity
  • Evaluation of Sensitivity to Noise
  • S/N Ratios for Static Problems
  • S/N Ratios for Dynamic Problems
  • Analysis of Ordered Categorical Data
  • Achieving Additivity
  • Guidelines for Selecting Quality Characteristics
  • Elements of Cost
  • Examples of Quality Characteristics
  • Examples of S/N Ratios
  • Selection of Control Factors
  • Role of Orthogonal Arrays
  • Constructing Orthogonal Arrays
  • Fundamental Principle
  • Tools Used in Robust Design
  • Applications and Benefits of Robust Design
  • Principles of Quality Engineering
  • Quality Loss Function--The Fraction Defective Fallacy
Dimensions
25 cm
Extent
xviii, 334 pages
Isbn
9780137451678
Lccn
89003927
Media category
unmediated
Media MARC source
rdamedia
Media type code
  • n
Other physical details
illustrations
System control number
  • (OCoLC)19455232
  • (OCoLC)ocm19455232

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