The Resource Test Generation of Crosstalk Delay Faults in VLSI Circuits, by S. Jayanthy, M.C. Bhuvaneswari, (electronic resource)

Test Generation of Crosstalk Delay Faults in VLSI Circuits, by S. Jayanthy, M.C. Bhuvaneswari, (electronic resource)

Label
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Title
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Statement of responsibility
by S. Jayanthy, M.C. Bhuvaneswari
Creator
Contributor
Author
Author
Provider
Subject
Language
eng
Summary
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing
http://library.link/vocab/creatorName
Jayanthy, S
http://bibfra.me/vocab/relation/httpidlocgovvocabularyrelatorsaut
  • m-K1iRW_ITk
  • yadYWJlSUjw
Image bit depth
0
LC call number
TK7888.4
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Bhuvaneswari, M.C.
  • SpringerLink
http://library.link/vocab/subjectName
  • Systems engineering
  • Microprogramming
  • Operating systems (Computers)
  • Logic design
  • Circuits and Systems
  • Control Structures and Microprogramming
  • Performance and Reliability
  • Logic Design
Label
Test Generation of Crosstalk Delay Faults in VLSI Circuits, by S. Jayanthy, M.C. Bhuvaneswari, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects -- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults -- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm -- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm -- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization -- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model -- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits
Dimensions
unknown
Extent
XI, 156 p. 49 illus., 7 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9789811324932
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-981-13-2493-2
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-981-13-2493-2
Label
Test Generation of Crosstalk Delay Faults in VLSI Circuits, by S. Jayanthy, M.C. Bhuvaneswari, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects -- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults -- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm -- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm -- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization -- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model -- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits
Dimensions
unknown
Extent
XI, 156 p. 49 illus., 7 illus. in color.
File format
multiple file formats
Form of item
electronic
Isbn
9789811324932
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-981-13-2493-2
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-981-13-2493-2

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