The Resource Transmission Electron Microscopy : Physics of Image Formation, by Helmut Kohl, Ludwig Reimer, (electronic resource)

Transmission Electron Microscopy : Physics of Image Formation, by Helmut Kohl, Ludwig Reimer, (electronic resource)

Label
Transmission Electron Microscopy : Physics of Image Formation
Title
Transmission Electron Microscopy
Title remainder
Physics of Image Formation
Statement of responsibility
by Helmut Kohl, Ludwig Reimer
Creator
Contributor
Author
Provider
Subject
Language
eng
Summary
Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated. Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text
Member of
http://library.link/vocab/creatorName
Kohl, Helmut
Image bit depth
0
Literary form
non fiction
http://library.link/vocab/relatedWorkOrContributorName
  • Reimer, Ludwig.
  • SpringerLink
Series statement
Springer Series in Optical Sciences,
Series volume
36
http://library.link/vocab/subjectName
  • Physics
  • Cytology
  • Condensed matter
  • Physical optics
  • Physics
  • Applied Optics, Optoelectronics, Optical Devices
  • Cell Biology
  • Condensed Matter
Label
Transmission Electron Microscopy : Physics of Image Formation, by Helmut Kohl, Ludwig Reimer, (electronic resource)
Instantiates
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Particle Optics of Electrons -- Wave Optics of Electrons -- Elements of a Transmission Electron Microscope -- Electron–Specimen Interactions. -- Scattering and Phase Contrast -- Theory of Electron Diffraction -- Electron-Diffraction Modesand Applications . -- Imaging of Crystalline Specimens and Their Defects. -- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy. -- Specimen Damage by Electron Irradiation
Dimensions
unknown
File format
multiple file formats
Form of item
electronic
Isbn
9780387347585
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-0-387-40093-8
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-0-387-34758-5
Label
Transmission Electron Microscopy : Physics of Image Formation, by Helmut Kohl, Ludwig Reimer, (electronic resource)
Publication
Antecedent source
mixed
Carrier category
online resource
Carrier category code
cr
Carrier MARC source
rdacarrier
Color
not applicable
Content category
text
Content type code
txt
Content type MARC source
rdacontent
Contents
Particle Optics of Electrons -- Wave Optics of Electrons -- Elements of a Transmission Electron Microscope -- Electron–Specimen Interactions. -- Scattering and Phase Contrast -- Theory of Electron Diffraction -- Electron-Diffraction Modesand Applications . -- Imaging of Crystalline Specimens and Their Defects. -- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy. -- Specimen Damage by Electron Irradiation
Dimensions
unknown
File format
multiple file formats
Form of item
electronic
Isbn
9780387347585
Level of compression
uncompressed
Media category
computer
Media MARC source
rdamedia
Media type code
c
Other control number
10.1007/978-0-387-40093-8
Other physical details
online resource.
Quality assurance targets
absent
Reformatting quality
access
Specific material designation
remote
System control number
(DE-He213)978-0-387-34758-5

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