Electronic circuits -- Testing -- Congresses
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The concept Electronic circuits -- Testing -- Congresses represents the subject, aboutness, idea or notion of resources found in Boston University Libraries.
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Electronic circuits -- Testing -- Congresses
Resource Information
The concept Electronic circuits -- Testing -- Congresses represents the subject, aboutness, idea or notion of resources found in Boston University Libraries.
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- Electronic circuits -- Testing -- Congresses
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- (uri) http://id.loc.gov/authorities/subjects/sh85042279
32 Items that share the Concept Electronic circuits -- Testing -- Congresses
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- ... East-West Design and Test Symposium
- 10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001
- 2008 14th IEEE International On-Line Testing Symposium : 7-9 July 2008
- 2008 17th Asian Test Symposium : 24-27 November 2008
- 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems : 25-27 April 2018, Budapest, Hungary
- 2018 IEEE 27th Asian Test Symposium : 15-18 October 2018, Hefei, China
- 2018 IEEE East-West Design & Test Symposium : 14-17 September 2018, Kazan, Russia
- 6th IEEE International On-Line Testing Workshop : proceedings, July 3-5, 2000, Palma De Mallorca, Spain
- 9th IEEE International On-Line Testing Symposium : IOLTS 2003 : proceedings, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece
- ATS '96 : proceedings of the Fifth Asian Test Symposium : November 20-22, 1996, Hsinchu, Taiwan
- ATS 2009 : proceedings : 2009 Asian Test Symposium : 23-26 November 2009, Taichung, Taiwan
- DDECS 2019 : 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems : proceedings : April 24-26, 2019, Cluj-Napoca, Romania
- IDT : proceedings of 2014 9th International Design & Test Symposium : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 2014
- IEEE Circuits and Systems International Conference on Testing and Diagnosis : ICTD
- IEEE International High-Level Design Validation and Test Workshop : 8-10 November 2000, Berkeley, California : proceedings
- IOLTS 2004 : 10th IEEE International On-Line Testing Symposium : proceedings : 12-14 July, 2004, Funchal, Madeira Island, Portugal
- IOLTS 2005 : 11th IEEE International On-Line Testing Symposium, Saint Raphael, French Riviera, France, 6-8 July 2005
- IOLTS 2006 : 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10-12, 2006
- IOLTS : 2014 IEEE 20th International On-Line Testing Symposium : 7-9 July 2014
- On-Line Testing Workshop : proceedings : Seventh International On-Line Testing Workshop : 9-11 July, 2001, Giardini Naxos, Taormina, Italy
- Proceedings
- Proceedings
- Proceedings
- Proceedings
- Proceedings Eighth Asian Test Symposium : 18 November 1999, Shanghai, China
- Proceedings Seventh Asian Test Symposium : 2-4 December 1998, Singapore
- Proceedings Sixth Asian Test Symposium : 17-19 November 1997, Akita, Japan
- Proceedings of the ... European Test Conference
- Proceedings of the 11th Asian Test Symposium (ATS '02) : 18-20 November, 2002, Guam, USA
- Proceedings of the 15th Asian Test Symposium : 20-23 November 2006, Fukuoka, Japan
- Proceedings of the Eighth IEEE International On-Line Testing Workshop : IOLTW 2002 : 8-10 July, 2002, Hotel Delos--Isle of Bendor, France
- Sixth IEEE International High-Level Design Validation and Test Workshop : proceedings : 7-9 November, 2001
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.bu.edu/resource/011_R5JAY-A/" typeof="CategoryCode http://bibfra.me/vocab/lite/Concept"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.bu.edu/resource/011_R5JAY-A/">Electronic circuits -- Testing -- Congresses</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.bu.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.bu.edu/">Boston University Libraries</a></span></span></span></span></div>
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<div class="citation" vocab="http://schema.org/"><i class="fa fa-external-link-square fa-fw"></i> Data from <span resource="http://link.bu.edu/resource/011_R5JAY-A/" typeof="CategoryCode http://bibfra.me/vocab/lite/Concept"><span property="name http://bibfra.me/vocab/lite/label"><a href="http://link.bu.edu/resource/011_R5JAY-A/">Electronic circuits -- Testing -- Congresses</a></span> - <span property="potentialAction" typeOf="OrganizeAction"><span property="agent" typeof="LibrarySystem http://library.link/vocab/LibrarySystem" resource="http://link.bu.edu/"><span property="name http://bibfra.me/vocab/lite/label"><a property="url" href="http://link.bu.edu/">Boston University Libraries</a></span></span></span></span></div>